QIII ST™

SURFACE PARTICLE DETECTOR 0.1-5um

Redefine productivity. Pentagon Technologies’ line of surface particle detectors are the standard in high technology industries for measuring and controlling surface contamination. Particles that accumulate on critical surfaces or products can reduce yield and reliability. To achieve optimal performance in particle sensitive manufacturing it is important to have a quantified metric for surface contamination. 

The QIII Surface Technology - QIII ST, uses an advanced, patented interface to re-suspend particulate from the surface and draw them through a particle detector. Use the QIII ST to find and eliminate the particles that cost you time and money.

Benefits

Technical Description

Options

Standard Probes

Large array of probes for measuring flat surfaces, inside pipes, gas lines, containers, or edges that are difficult to clean.

Custom Probes

We can design a probe to fit custom surfaces.

Particle Analysis Module Probe

Capture the particles for analysis.

BKM Mode

Best Known Method captures measuring points, specifications, and image of surface being tested.

Robotic Cell

Connect remotely to for in-situ measurements.

Battery Charger

Charge an additional set of batteries.

Products

Get the best tools for measuring and controlling surface contamination